---
格式版本: 2
标题: "Automated Estimation of MBIST Area and Test Time in Heterogeneous Memory IPs via Stacked Ensemble Framework"
原文链接: "https://arxiv.org/abs/2608.19705"
发布日期: "2026-08-20"
发布时间校准状态: "found"
发布时间需复核: "否"
发布时间来源: "rule:local:strict_original_body"
发布时间证据: "**\\[v1\\]** Thu, 20 Aug 2026 07:06:15 UTC (3,321 KB)"
发布时间校准原因: "规则确认唯一严格发布时间，来源 local:strict_original_body"
发布时间校准置信度: "high"
发布时间候选数量: 18
发布时间严格候选数量: 6
发布时间原页读取状态: "source template page reused from URL open"
发布时间未找到原因: ""
发布时间校准时间: "2026-08-21T16:17:37+08:00"
发布时间仲裁状态: "skipped"
发布时间仲裁尝试次数: 0
发布时间仲裁耗时毫秒: 0
发现时间: "2026-08-21T16:16:43+08:00"
入库时间: "2026-08-21T08:17:37.450Z"
来源平台: "arXiv 学术论文搜索"
搜索渠道: "source_template"
搜索词: "https://arxiv.org/search/?query=Meta&searchtype=all"
匹配关键词:
  - "performance"
相关厂家:
  - "Meta"
相关专家:
  []
内容类型: "网页"
抓取工具: "Free Fetch + Defuddle"
清洗工具: "Defuddle Markdown + Defuddle/Readability 正文提取"
原始附件:
  []
AI优质: "否"
AI打分: 35
AI分档: "非优质"
AI质检状态: "不通过"
AI打分理由: "论文内容为MBIST面积与测试时间估计的机器学习方法，涉及内存测试优化，与超节点/AI Rack机柜级AI基础设施无实质关联。"
AI质检模型: "tx-deepseek-v4-flash"
AI质检时间: "2026-08-21T16:17:56+08:00"
AI主题相关性: 0
AI来源权威性: 15
AI新颖性: 5
AI技术细节: 5
AI商业部署信号: 0
AI完整性: 10
AI摘要: "该研究提出一个基于堆叠集成学习的框架，直接从RTL级设计参数预测异构存储IP的MBIST面积与测试时间，无需综合。模型在面积预测上准确率达90.68%，测试时间预测为96.80%，为存储IP设计规划提供了更快速的成本估算方案。"
AI摘要模型: "ali-deepseek-v4-flash"
AI摘要时间: "2026-09-07T02:12:14.601Z"
采集批次: "2026年8月21日13点55分53秒"
采集批次ID: "20260821-135553-743"
去重键: "https://arxiv.org/abs/2608.19705"
---

## Computer Science > Hardware Architecture

## Title:Automated Estimation of MBIST Area and Test Time in Heterogeneous Memory IPs via Stacked Ensemble Framework

[View PDF](https://arxiv.org/pdf/2608.19705) [HTML (experimental)](https://arxiv.org/html/2608.19705v1)

> Abstract:Embedded memories occupy a large portion of modern System-on-Chip (SoC) designs, especially in high-performance applications such as artificial intelligence and edge computing. Memory Built-In Self-Test (MBIST) is commonly used to ensure memory reliability, but it introduces additional area and test time overhead. Accurate early estimation of these overheads is important during design planning, yet conventional methods rely on full Register Transfer Level (RTL) synthesis and test pattern generation, which are slow and resource-intensive. This study proposes a supervised learning framework that predicts MBIST area and test time directly from RTL-level design parameters without synthesis. A dataset of 4,470 samples for area and 624 for test time was generated using Synopsys Design Compiler and MINT, an Intel-enhanced MBIST tool. Input features include memory count, word width, address depth, port configuration, and clock domains. For area prediction, the features are processed through polynomial expansion, log transformation, and scaling, followed by a stacked ensemble model using XGBoost, LightGBM, and a Neural Network with Gradient Boosting as the meta-learner. For test time, XGBoost and LightGBM are combined using Ridge Regression, with hyperparameters tuned through a 100-trial Optuna search. The models achieved 90.68% accuracy for area and 96.80% for test time within a +/-10% margin, improving over baseline methods by 8.53% and 48.80% respectively. The results show that this approach enables faster estimation of MBIST costs and supports more efficient design decisions in memory IP development.

| Subjects: | Hardware Architecture (cs.AR) |
| --- | --- |
| Cite as: | [arXiv:2608.19705](https://arxiv.org/abs/2608.19705) \[cs.AR\] |
|  | (or [arXiv:2608.19705v1](https://arxiv.org/abs/2608.19705v1) \[cs.AR\] for this version) |
|  | [https://doi.org/10.48550/arXiv.2608.19705](https://doi.org/10.48550/arXiv.2608.19705) |

## Submission history

From: Nuzhat Khan \[[view email](https://arxiv.org/show-email/2976d7ab/2608.19705)\]  
**\[v1\]** Thu, 20 Aug 2026 07:06:15 UTC (3,321 KB)

[Which authors of this paper are endorsers?](https://arxiv.org/auth/show-endorsers/2608.19705) | Disable MathJax ([What is MathJax?](https://info.arxiv.org/help/mathjax.html))